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Comprehensive SEM & FESEM Imaging Services

High-resolution imaging of your materials' surfaces and structures.

Our SEM & FESEM Services Include:

SEM Sample Preparation: Proper preparation for optimal imaging.
FESEM Imaging: High-resolution imaging with Field Emission SEM.
FESEM Imaging with EDX Analysis:
- Point: Elemental analysis at a specific point.
- Line: Elemental composition along a line.
- Mapping: Elemental distribution across an area.
Floor-type SEM Imaging with/without EDS: Larger samples and versatile configurations.
Table top SEM Imaging with/without EDS: Compact, easy-to-use SEM for smaller samples.

Visualize your material down to the microstructural level. Contact us for SEM & FESEM Services.

SEM and FESEM Imaging at CAPLINQ for high-resolution analysis

X-ray Imaging at CAPLINQ for 2D and 3D analysis

Advanced X-ray Imaging Services

Examine the inner structure of your materials with X-ray technology.

Our X-ray Services Offer:

2D X-ray: Traditional radiography for planar views.
3D X-ray: Computed tomography for volumetric analysis.

Investigate internal defects and structures non-destructively. Schedule your X-ray Imaging.

Atomic Force & Transmission Electron Microscopy

Detailed analysis at the nano level with AFM and TEM.

Our AFM & TEM Services:

AFM: Surface topography and mechanical properties at atomic scale.
TEM Sample Preparation: Specialized preparation for ultra-thin samples.
TEM Only: High-resolution imaging of internal structures.
TEM with EDS: Elemental mapping and analysis within the sample.

Explore materials at their finest detail. Request AFM or TEM Analysis.

AFM and TEM Imaging at CAPLINQ for nanoscale precision

AES and TOFSIMS Analysis at CAPLINQ for surface and depth profiling

Auger Electron & Time-of-Flight Secondary Ion Mass Spectrometry

Advanced techniques for surface and depth composition analysis.

Our AES & TOFSIMS Services:

AES:
- Point: Elemental analysis at a single point.
- Line: Elemental distribution along a line.
- Mapping: Elemental distribution over an area.
- Depth Profiling: Elemental composition vs. depth.
TOFSIMS:
- Point: Molecular species identification.
- Mapping: Molecular distribution mapping.
- Depth Profiling: Molecular composition with depth.

Get detailed insights into your material’s surface chemistry. Contact us for AES & TOFSIMS.

Frequently Asked Questions about Imaging Services

What materials can be analyzed with these imaging techniques?

From metals to polymers, semiconductors to biological samples, our imaging services can handle a wide array of materials.

How does SEM differ from FESEM?

FESEM (Field Emission SEM) provides higher resolution due to the use of a field emission gun source, allowing for finer detail and better imaging of non-conductive samples.