HPA-LU-M | Low Th & U Alumina
- 4N - 5N Purity
- Ultra low uranium & Thorium
- Ideal as an EMC filler
Product Description
HPA-LU-M is characterized by its exceptionally low levels of uranium and thorium, achieving an impressive purity range of 4N to 5N (99.99% to 99.999%). This ultra-pure material is applicable for critical applications where minimal radioactive impurities are essential, making it particularly well-suited for semiconductor epoxy molding compound (EMC) fillers and other advanced technologies.
HPA-LU-M features an irregular particle morphology that enhances surface contact, resulting in increased dispersion and integration in composite materials. Its specific surface area, ranging from 8 to 15 m²/g, ensures controlled reactivity and stability, contributing to consistent performance across various high-tech applications. With a D50 particle size distribution between 1-5 µm, this alumina product guarantees uniform mixing and processing, crucial for industries that demand precision and reliability. Whether used in semiconductor manufacturing, advanced ceramics, specialty coatings, or optoelectronics
Technical Specifications
General Properties | |||||||||||
Density (g) | 0.3 - 0.5 g/cm3 | ||||||||||
Morphology | Irregular | ||||||||||
Particle size (D50) | 1 - 5 um | ||||||||||
Purity | 99.99 - 99.999 % | ||||||||||
Surface Area | 8 - 15 m2/g | ||||||||||
Chemical Properties | |||||||||||
Phase | a | ||||||||||
Other Properties | |||||||||||
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Additional Information
Purity | Key Element concentration (ppmw) | ||||||||
Na | Mg | Si | Ca | Ti | Cu | Cr | Fe | K | |
4N | <30 | <5 | <10 | <10 | <5 | <5 | <5 | <20 | <10 |
5N | <4 | <1 | <3 | <3 | <0.5 | <0.5 | <1 | <1 | <0.5 |
Applications
Epoxy Molding Compound (EMC) Fillers
Increasing relative dielectric constant of the Al2O3/epoxy composites as a function of the Al2O3 content
Reference: https://doi.org/10.1016/j.compscitech.2016.01.010
Additionaly, HPA increased the flexural strength of the epoxy molding compound. The table below shows that the flexural strength are remarkably higher on epoxy system with Al2O3 as fillers compared to silica and AlN.
Composites | Filler cont. (Vol.%) | Flex. Strength (Mpa) | Therm. Conduct. (W/m-K) |
---|---|---|---|
AlN/Epoxy | 58 | 101.3 | 3.56 |
Al2O3/Epoxy | 60 | – | 4.3 |
Al2O3/Epoxy | 58 | 150.9 | 7.15 |
AlN/Epoxy | 70 | 180 | 4.6 |
Cryst. SiO2/Epoxy | 70 | 145 | 2.0 |
Diamond/Epoxy | 68 | – | 4.1 |
Al2O3/Epoxy | 70 | 304.9 | 13.46 |
Semiconductor Manufacturing
In semiconductor applications, the ultra-low impurities of HPU-LU-M reduce the risk of contamination, which can cause device failure or decreased performance. The material's high thermal stability and purity ensure that it performs well in the demanding environments of semiconductor fabrication processes.
Advanced Technical Ceramics
The controlled morphology and high purity of HPU-LU-M enhance the mechanical and electrical properties of technical ceramics. These properties are essential for applications requiring high strength, wear resistance, and low dielectric loss, such as substrates, insulators, and advanced structural components.
Additional Information
HPU-LU-M is produced using state-of-the-art manufacturing techniques that ensure the highest standards of quality and purity. Our advanced processing technology guarantees consistent product performance, making it a reliable choice for high-tech applications. Customizable solutions are available to meet specific application needs, supported by our expert technical team and collaborative R&D partnerships.